ADI DS2174Q+

Усовершенствованный тестер частоты битовых ошибок (EBERT)Е1, J1, Т13 В ~ 3,6 В

Overview

The DS2174Q enhanced bit error rate tester (EBERT) is a software-programmable test-pattern generator, receiver, and analyzer capable of meeting the most stringent error-performance requirements of digital transmission facilities. It features bit-serial, nibble-parallel, and byte-parallel data interfaces, and generates and uniquely synchronizes to pseudorandom patterns of the form 2n - 1, where n can take on values from 1 to 32, and user-defined repetitive patterns of any length up to 512 octets.

■ Generates and detects digital patterns for analyzing and trouble-shooting digital communications systems■ Programmable polynomial length and feedback taps for generation of any pseudorandom patterns up to 232 - 1; up to 32 taps can be used in the feedback path■ Programmable, user-defined pattern registers for long repetitive patterns up to 512 bytes in length■ Large 48-bit count and bit error count registers■ Software-programmable bit error insertion■ Fully independent transmit and receive paths■ 8-bit parallel-control port■ Detects polynomial test patterns in the presence of bit error rates up to 10-2■ Programmable for serial, 4-bit parallel, or 8-bit parallel data interfaces■ Serial mode clock rate is 155MHz; byte mode is 80MHz for a net 622Mbps; OC-3■ Available in 44-pin PLCC

Features

Applications

• Add/Drop multiplexers (ADMs)
• T1/E1/J1 add/drop multiplexers (MUX)
• Channel Service Units (CSUs): T1/E1/J1
• Fractional T1/E1/J1
• BITS Timing
• Digital Access Cross-connect System (DACs)
• Digital Cross-connect Systems (DCS)
• Frame Relay Switches and Access Devices (FRADS)
• ISDN Primary Rate Interfaces (PRA)
• PBXs channel bank