TI SN74ABTH18646APM

Сканирование тестового устройства с приемопередатчиками и регистрами4,5 В ~ 5,5 В18

Overview

The 'ABTH18646A and 'ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

The data-output functions can be enabled or disabled by various signals atand DIR. Data-input functions are always enabled; i.e., data at the bus pins is stored on every low-to-high transition of the clock inputs.

Features

Applications

• Wired telephone
• Cordless telephone
• Desktop PC
• Notebook
• Pocket PC
• Desktop radio
• Clock radio
• Tuner
• Portable radio
• Car radio